Field-of-view extension and XY-drift correction in microscopy for large samples
Resumen:
We propose a method for sample XY-drift correction by means of feature detection and correlation analysis along with field-of-view extension for large sample images taken through a microscope with a motorized XY stage.
| 2022 | |
| Agencia Nacional de Investigación e Innovación ANII (Grant number FMV_2019_1_156126). | |
|
Microscopio Impresión 3D Muestras |
|
| Inglés | |
| Universidad de la República | |
| COLIBRI | |
| https://hdl.handle.net/20.500.12008/32860 | |
| Acceso abierto | |
| Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| _version_ | 1807522889743728640 |
|---|---|
| author | Silva, Alejandro |
| author2 | Arocena, Miguel Alonso, Julia R. |
| author2_role | author author |
| author_facet | Silva, Alejandro Arocena, Miguel Alonso, Julia R. |
| author_role | author |
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| collection | COLIBRI |
| dc.contributor.filiacion.none.fl_str_mv | Silva Alejandro, Universidad de la República (Uruguay). Facultad de Ingeniería Arocena Miguel, Universidad de la República (Uruguay). Cátedra de Bioquímica y Biofísica, Facultad de Odontología. Alonso Julia R., Universidad de la República (Uruguay). Facultad de Ingeniería |
| dc.creator.none.fl_str_mv | Silva, Alejandro Arocena, Miguel Alonso, Julia R. |
| dc.date.accessioned.none.fl_str_mv | 2022-08-03T12:43:03Z |
| dc.date.available.none.fl_str_mv | 2022-08-03T12:43:03Z |
| dc.date.issued.none.fl_str_mv | 2022 |
| dc.description.abstract.none.fl_txt_mv | We propose a method for sample XY-drift correction by means of feature detection and correlation analysis along with field-of-view extension for large sample images taken through a microscope with a motorized XY stage. |
| dc.description.sponsorship.none.fl_txt_mv | Agencia Nacional de Investigación e Innovación ANII (Grant number FMV_2019_1_156126). |
| dc.format.mimetype.es.fl_str_mv | application/pdf |
| dc.identifier.citation.es.fl_str_mv | Silva, A., Arocena, M. y Alonso, J. Field-of-view extension and XY-drift correction in microscopy for large samples [Preprint] Publicado en : Imaging and Applied Optics Congress , 11 -15 july, 2022. |
| dc.identifier.uri.none.fl_str_mv | https://hdl.handle.net/20.500.12008/32860 |
| dc.language.iso.none.fl_str_mv | en eng |
| dc.relation.ispartof.es.fl_str_mv | Imaging and Applied Optics Congress, 11 -15 july 2022 |
| dc.rights.license.none.fl_str_mv | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| dc.rights.none.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.source.none.fl_str_mv | reponame:COLIBRI instname:Universidad de la República instacron:Universidad de la República |
| dc.subject.es.fl_str_mv | Microscopio Impresión 3D Muestras |
| dc.title.none.fl_str_mv | Field-of-view extension and XY-drift correction in microscopy for large samples |
| dc.type.es.fl_str_mv | Preprint |
| dc.type.none.fl_str_mv | info:eu-repo/semantics/preprint |
| dc.type.version.none.fl_str_mv | info:eu-repo/semantics/submittedVersion |
| description | We propose a method for sample XY-drift correction by means of feature detection and correlation analysis along with field-of-view extension for large sample images taken through a microscope with a motorized XY stage. |
| eu_rights_str_mv | openAccess |
| format | preprint |
| id | COLIBRI_aed6cf7515b75efae84f9b1d704c03f2 |
| identifier_str_mv | Silva, A., Arocena, M. y Alonso, J. Field-of-view extension and XY-drift correction in microscopy for large samples [Preprint] Publicado en : Imaging and Applied Optics Congress , 11 -15 july, 2022. |
| instacron_str | Universidad de la República |
| institution | Universidad de la República |
| instname_str | Universidad de la República |
| language | eng |
| language_invalid_str_mv | en |
| network_acronym_str | COLIBRI |
| network_name_str | COLIBRI |
| oai_identifier_str | oai:colibri.udelar.edu.uy:20.500.12008/32860 |
| publishDate | 2022 |
| reponame_str | COLIBRI |
| repository.mail.fl_str_mv | mabel.seroubian@seciu.edu.uy |
| repository.name.fl_str_mv | COLIBRI - Universidad de la República |
| repository_id_str | 4771 |
| rights_invalid_str_mv | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| spelling | Silva Alejandro, Universidad de la República (Uruguay). Facultad de IngenieríaArocena Miguel, Universidad de la República (Uruguay). Cátedra de Bioquímica y Biofísica, Facultad de Odontología.Alonso Julia R., Universidad de la República (Uruguay). Facultad de Ingeniería2022-08-03T12:43:03Z2022-08-03T12:43:03Z2022Silva, A., Arocena, M. y Alonso, J. Field-of-view extension and XY-drift correction in microscopy for large samples [Preprint] Publicado en : Imaging and Applied Optics Congress , 11 -15 july, 2022.https://hdl.handle.net/20.500.12008/32860We propose a method for sample XY-drift correction by means of feature detection and correlation analysis along with field-of-view extension for large sample images taken through a microscope with a motorized XY stage.Submitted by Cabrera Gabriela (gfcabrerarossi@gmail.com) on 2022-07-28T13:41:49Z No. of bitstreams: 2 license_rdf: 23149 bytes, checksum: 1996b8461bc290aef6a27d78c67b6b52 (MD5) SAA22.pdf: 4314658 bytes, checksum: 3a335fe7b53bc219b2bd31b13877d24c (MD5)Approved for entry into archive by Machado Jimena (jmachado@fing.edu.uy) on 2022-08-02T22:28:25Z (GMT) No. of bitstreams: 2 license_rdf: 23149 bytes, checksum: 1996b8461bc290aef6a27d78c67b6b52 (MD5) SAA22.pdf: 4314658 bytes, checksum: 3a335fe7b53bc219b2bd31b13877d24c (MD5)Made available in DSpace by Luna Fabiana (fabiana.luna@seciu.edu.uy) on 2022-08-03T12:43:03Z (GMT). No. of bitstreams: 2 license_rdf: 23149 bytes, checksum: 1996b8461bc290aef6a27d78c67b6b52 (MD5) SAA22.pdf: 4314658 bytes, checksum: 3a335fe7b53bc219b2bd31b13877d24c (MD5) Previous issue date: 2022Agencia Nacional de Investigación e Innovación ANII (Grant number FMV_2019_1_156126).application/pdfenengImaging and Applied Optics Congress, 11 -15 july 2022Las obras depositadas en el Repositorio se rigen por la Ordenanza de los Derechos de la Propiedad Intelectual de la Universidad de la República.(Res. Nº 91 de C.D.C. de 8/III/1994 – D.O. 7/IV/1994) y por la Ordenanza del Repositorio Abierto de la Universidad de la República (Res. Nº 16 de C.D.C. de 07/10/2014)info:eu-repo/semantics/openAccessLicencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)MicroscopioImpresión 3DMuestrasField-of-view extension and XY-drift correction in microscopy for large samplesPreprintinfo:eu-repo/semantics/preprintinfo:eu-repo/semantics/submittedVersionreponame:COLIBRIinstname:Universidad de la Repúblicainstacron:Universidad de la RepúblicaSilva, AlejandroArocena, MiguelAlonso, Julia R.LICENSElicense.txtlicense.txttext/plain; charset=utf-84267http://localhost:8080/xmlui/bitstream/20.500.12008/32860/9/license.txt6429389a7df7277b72b7924fdc7d47a9MD59CC-LICENSElicense_urllicense_urltext/plain; charset=utf-850http://localhost:8080/xmlui/bitstream/20.500.12008/32860/6/license_urla006180e3f5b2ad0b88185d14284c0e0MD56license_textlicense_texttext/html; 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- Universidad de la Repúblicafalse |
| spellingShingle | Field-of-view extension and XY-drift correction in microscopy for large samples Silva, Alejandro Microscopio Impresión 3D Muestras |
| status_str | submittedVersion |
| title | Field-of-view extension and XY-drift correction in microscopy for large samples |
| title_full | Field-of-view extension and XY-drift correction in microscopy for large samples |
| title_fullStr | Field-of-view extension and XY-drift correction in microscopy for large samples |
| title_full_unstemmed | Field-of-view extension and XY-drift correction in microscopy for large samples |
| title_short | Field-of-view extension and XY-drift correction in microscopy for large samples |
| title_sort | Field-of-view extension and XY-drift correction in microscopy for large samples |
| topic | Microscopio Impresión 3D Muestras |
| url | https://hdl.handle.net/20.500.12008/32860 |
