Field-of-view extension and XY-drift correction in microscopy for large samples
Resumen:
We propose a method for sample XY-drift correction by means of feature detection and correlation analysis along with field-of-view extension for large sample images taken through a microscope with a motorized XY stage.
| 2022 | |
| Agencia Nacional de Investigación e Innovación ANII (Grant number FMV_2019_1_156126). | |
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Microscopio Impresión 3D Muestras |
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| Inglés | |
| Universidad de la República | |
| COLIBRI | |
| https://hdl.handle.net/20.500.12008/32860 | |
| Acceso abierto | |
| Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
