Silva, A., Arocena, M., & Alonso, J. R. (2022). Field-of-view extension and XY-drift correction in microscopy for large samples.
Cita Chicago Style (17a ed.)Silva, Alejandro, Miguel Arocena, y Julia R. Alonso. Field-of-view Extension and XY-drift Correction in Microscopy for Large Samples. 2022.
Cita MLA (9a ed.)Silva, Alejandro, et al. Field-of-view Extension and XY-drift Correction in Microscopy for Large Samples. 2022.
Precaución: Estas citas no son 100% exactas.