Optimum nMOS/pMOS imbalance for energy efficient digital circuits

Veirano Núñez, Francisco - Naviner, Lirida - Silveira, Fernando

Resumen:

In this paper, we propose an asymmetrical length biasing scheme to be used in advanced nanometer technologies, which minimizes the energy per operation consumption of sub/near threshold digital CMOS circuits. Simulation results of two test circuits, a chain of inverters and a ripple carry adder, show that by using this sizing approach, the energy per operation can be reduced in more than 50% in a wide range of target performances. We use a 28-nm ultra-thin body and box fully depleted silicon-on-insulator technology and we show that the combination of supply voltage scaling, backplane biasing, and length biasing can be combined to obtain extremely robust (variability is almost halved) and energy efficient digital circuits. We also show simulation results for predictive technology models to show that the technique is also compatible with conventional bulk technologies


Detalles Bibliográficos
2017
Integrated circuit modeling
MOS devices
Transistors
Mathematical model
Leakage currents
Digital circuits
Low energy
Asymmetric length biasing
Poly biasing
nMOS/pMOS imbalance
Minimum energy point
Electrónica
Inglés
Universidad de la República
COLIBRI
https://hdl.handle.net/20.500.12008/43535
Acceso abierto
Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)
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author Veirano Núñez, Francisco
author2 Naviner, Lirida
Silveira, Fernando
author2_role author
author
author_facet Veirano Núñez, Francisco
Naviner, Lirida
Silveira, Fernando
author_role author
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collection COLIBRI
dc.creator.none.fl_str_mv Veirano Núñez, Francisco
Naviner, Lirida
Silveira, Fernando
dc.date.accessioned.none.fl_str_mv 2024-04-16T16:21:16Z
dc.date.available.none.fl_str_mv 2024-04-16T16:21:16Z
dc.date.issued.es.fl_str_mv 2017
dc.date.submitted.es.fl_str_mv 20240416
dc.description.abstract.none.fl_txt_mv In this paper, we propose an asymmetrical length biasing scheme to be used in advanced nanometer technologies, which minimizes the energy per operation consumption of sub/near threshold digital CMOS circuits. Simulation results of two test circuits, a chain of inverters and a ripple carry adder, show that by using this sizing approach, the energy per operation can be reduced in more than 50% in a wide range of target performances. We use a 28-nm ultra-thin body and box fully depleted silicon-on-insulator technology and we show that the combination of supply voltage scaling, backplane biasing, and length biasing can be combined to obtain extremely robust (variability is almost halved) and energy efficient digital circuits. We also show simulation results for predictive technology models to show that the technique is also compatible with conventional bulk technologies
dc.description.es.fl_txt_mv Trabajo publicado en IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 64, no. 12
dc.identifier.citation.es.fl_str_mv Veirano, F, Naviner, L, Silveira, F. "Optimum nMOS/pMOS Imbalance for Energy Efficient Digital Circuits" Publicado en: IEEE Transactions on Circuits and Systems I: Regular Papers, v. 64, no. 12, pp. 3081-3091, 2017, doi: 10.1109/TCSI.2017.2747480
dc.identifier.uri.none.fl_str_mv https://hdl.handle.net/20.500.12008/43535
dc.language.iso.none.fl_str_mv en
eng
dc.rights.license.none.fl_str_mv Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
dc.source.none.fl_str_mv reponame:COLIBRI
instname:Universidad de la República
instacron:Universidad de la República
dc.subject.es.fl_str_mv Integrated circuit modeling
MOS devices
Transistors
Mathematical model
Leakage currents
Digital circuits
Low energy
Asymmetric length biasing
Poly biasing
nMOS/pMOS imbalance
Minimum energy point
dc.subject.other.es.fl_str_mv Electrónica
dc.title.none.fl_str_mv Optimum nMOS/pMOS imbalance for energy efficient digital circuits
dc.type.es.fl_str_mv Artículo
dc.type.none.fl_str_mv info:eu-repo/semantics/article
dc.type.version.none.fl_str_mv info:eu-repo/semantics/publishedVersion
description Trabajo publicado en IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 64, no. 12
eu_rights_str_mv openAccess
format article
id COLIBRI_12743f8ce86920a668942141218e3899
identifier_str_mv Veirano, F, Naviner, L, Silveira, F. "Optimum nMOS/pMOS Imbalance for Energy Efficient Digital Circuits" Publicado en: IEEE Transactions on Circuits and Systems I: Regular Papers, v. 64, no. 12, pp. 3081-3091, 2017, doi: 10.1109/TCSI.2017.2747480
instacron_str Universidad de la República
institution Universidad de la República
instname_str Universidad de la República
language eng
language_invalid_str_mv en
network_acronym_str COLIBRI
network_name_str COLIBRI
oai_identifier_str oai:colibri.udelar.edu.uy:20.500.12008/43535
publishDate 2017
reponame_str COLIBRI
repository.mail.fl_str_mv mabel.seroubian@seciu.edu.uy
repository.name.fl_str_mv COLIBRI - Universidad de la República
repository_id_str 4771
rights_invalid_str_mv Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)
spelling 2024-04-16T16:21:16Z2024-04-16T16:21:16Z201720240416Veirano, F, Naviner, L, Silveira, F. "Optimum nMOS/pMOS Imbalance for Energy Efficient Digital Circuits" Publicado en: IEEE Transactions on Circuits and Systems I: Regular Papers, v. 64, no. 12, pp. 3081-3091, 2017, doi: 10.1109/TCSI.2017.2747480https://hdl.handle.net/20.500.12008/43535Trabajo publicado en IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 64, no. 12In this paper, we propose an asymmetrical length biasing scheme to be used in advanced nanometer technologies, which minimizes the energy per operation consumption of sub/near threshold digital CMOS circuits. Simulation results of two test circuits, a chain of inverters and a ripple carry adder, show that by using this sizing approach, the energy per operation can be reduced in more than 50% in a wide range of target performances. We use a 28-nm ultra-thin body and box fully depleted silicon-on-insulator technology and we show that the combination of supply voltage scaling, backplane biasing, and length biasing can be combined to obtain extremely robust (variability is almost halved) and energy efficient digital circuits. We also show simulation results for predictive technology models to show that the technique is also compatible with conventional bulk technologiesMade available in DSpace on 2024-04-16T16:21:16Z (GMT). No. of bitstreams: 5 VNS17.pdf: 1048412 bytes, checksum: 8c21c5738fe8f5cfa7e7eac3cb709970 (MD5) license_text: 21936 bytes, checksum: 9833653f73f7853880c94a6fead477b1 (MD5) license_url: 49 bytes, checksum: 4afdbb8c545fd630ea7db775da747b2f (MD5) license_rdf: 23148 bytes, checksum: 9da0b6dfac957114c6a7714714b86306 (MD5) license.txt: 4244 bytes, checksum: 528b6a3c8c7d0c6e28129d576e989607 (MD5) Previous issue date: 2017enengLas obras depositadas en el Repositorio se rigen por la Ordenanza de los Derechos de la Propiedad Intelectual de la Universidad De La República. (Res. Nº 91 de C.D.C. de 8/III/1994 – D.O. 7/IV/1994) y por la Ordenanza del Repositorio Abierto de la Universidad de la República (Res. Nº 16 de C.D.C. de 07/10/2014)info:eu-repo/semantics/openAccessLicencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)Integrated circuit modelingMOS devicesTransistorsMathematical modelLeakage currentsDigital circuitsLow energyAsymmetric length biasingPoly biasingnMOS/pMOS imbalanceMinimum energy pointElectrónicaOptimum nMOS/pMOS imbalance for energy efficient digital circuitsArtículoinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionreponame:COLIBRIinstname:Universidad de la Repúblicainstacron:Universidad de la RepúblicaVeirano Núñez, FranciscoNaviner, LiridaSilveira, FernandoElectrónicaMicroelectrónicaLICENSElicense.txttext/plain4244http://localhost:8080/xmlui/bitstream/20.500.12008/43535/5/license.txt528b6a3c8c7d0c6e28129d576e989607MD55CC-LICENSElicense_textapplication/octet-stream21936http://localhost:8080/xmlui/bitstream/20.500.12008/43535/2/license_text9833653f73f7853880c94a6fead477b1MD52license_urlapplication/octet-stream49http://localhost:8080/xmlui/bitstream/20.500.12008/43535/3/license_url4afdbb8c545fd630ea7db775da747b2fMD53license_rdfapplication/octet-stream23148http://localhost:8080/xmlui/bitstream/20.500.12008/43535/4/license_rdf9da0b6dfac957114c6a7714714b86306MD54ORIGINALVNS17.pdfapplication/pdf1048412http://localhost:8080/xmlui/bitstream/20.500.12008/43535/1/VNS17.pdf8c21c5738fe8f5cfa7e7eac3cb709970MD5120.500.12008/435352024-07-24 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- Universidad de la Repúblicafalse
spellingShingle Optimum nMOS/pMOS imbalance for energy efficient digital circuits
Veirano Núñez, Francisco
Integrated circuit modeling
MOS devices
Transistors
Mathematical model
Leakage currents
Digital circuits
Low energy
Asymmetric length biasing
Poly biasing
nMOS/pMOS imbalance
Minimum energy point
Electrónica
status_str publishedVersion
title Optimum nMOS/pMOS imbalance for energy efficient digital circuits
title_full Optimum nMOS/pMOS imbalance for energy efficient digital circuits
title_fullStr Optimum nMOS/pMOS imbalance for energy efficient digital circuits
title_full_unstemmed Optimum nMOS/pMOS imbalance for energy efficient digital circuits
title_short Optimum nMOS/pMOS imbalance for energy efficient digital circuits
title_sort Optimum nMOS/pMOS imbalance for energy efficient digital circuits
topic Integrated circuit modeling
MOS devices
Transistors
Mathematical model
Leakage currents
Digital circuits
Low energy
Asymmetric length biasing
Poly biasing
nMOS/pMOS imbalance
Minimum energy point
Electrónica
url https://hdl.handle.net/20.500.12008/43535