Abstract: The Kenyan wheat (Triticum aestivum L.) ?Kenya Kongoni ?exhibits high levels of adult plant resistance (APR) to leaf rust (LR) and yellowrust (YR). We determined the genomic regions associated with LR and YR resistance in a population of 148 recombinant inbred lines generatedfrom a cross between ? Avocet-YrA ?and Kenya Kongoni. Field experi-ments to characterize APR to LR and YR were conducted in four andtwo Mexican or Uruguayan environments, respectively. A linkage map was constructed with 438 diversity arrays technology and 16 simple-sequence repeat markers by JoinMap 4.1 software. Genetic analyses showed that resistance to both rusts was determined by four to fiveAPR genes, including Lr46/Yr29 and Sr2/Lr27/Yr30 . Quantitative trait loci (QTL) analysis indicated that pleiotropic APR loci QYLr.cim-1BLcorresponding to Lr46/Yr29 and QYLr.cim-7BL that is a putative novel QTL accounted for 5 to 57% and 12 to 35% of the phenotypic variationfor resistance to LR and YR, respectively. These loci, in combination with another three LR QTL and two YR QTL, respectively, conferredhigh levels of resistance to both LR and YR in wheat under Mexican and Uruguayan environments. Among ot her detected QTL, QLr.cim-1DS,QLr.cim-2BL, and QYLr.icm-7BL may be new loci for APR to both rusts in common wheat.