Low-cost signature test of Rf blocks based on envelope response analysis
Resumen:
This paper presents a novel and low-cost methodologythat can be used for testing RF blocks embedded in complex SoCs.It is based on the detection and analysis of the two-tone responseenvelope of the device under test (DUT). The response envelope isprocessed to obtain a simple digital signature sensitive to keyspecifications of the DUT. The analytical basis of the proposedmethodology is demonstrated, and a proposal for itsimplementation as a built-in test core is discussed. Finally,practical simulation examples show the feasibility of the approach.
| 2010 | |
|
RF test RF BIST Signature test |
|
| Inglés | |
| Universidad de la República | |
| COLIBRI | |
| https://hdl.handle.net/20.500.12008/38641 | |
| Acceso abierto | |
| Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| _version_ | 1807522933433696256 |
|---|---|
| author | Barragán, Manuel J |
| author2 | Fiorelli, Rafaella Vázquez, Diego Rueda, Adoración Huertas, José Luis |
| author2_role | author author author author |
| author_facet | Barragán, Manuel J Fiorelli, Rafaella Vázquez, Diego Rueda, Adoración Huertas, José Luis |
| author_role | author |
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| collection | COLIBRI |
| dc.creator.none.fl_str_mv | Barragán, Manuel J Fiorelli, Rafaella Vázquez, Diego Rueda, Adoración Huertas, José Luis |
| dc.date.accessioned.none.fl_str_mv | 2023-08-01T20:33:08Z |
| dc.date.available.none.fl_str_mv | 2023-08-01T20:33:08Z |
| dc.date.issued.es.fl_str_mv | 2010 |
| dc.date.submitted.es.fl_str_mv | 20230801 |
| dc.description.abstract.none.fl_txt_mv | This paper presents a novel and low-cost methodologythat can be used for testing RF blocks embedded in complex SoCs.It is based on the detection and analysis of the two-tone responseenvelope of the device under test (DUT). The response envelope isprocessed to obtain a simple digital signature sensitive to keyspecifications of the DUT. The analytical basis of the proposedmethodology is demonstrated, and a proposal for itsimplementation as a built-in test core is discussed. Finally,practical simulation examples show the feasibility of the approach. |
| dc.identifier.citation.es.fl_str_mv | Barragán, M. Fiorelli, R, Vázquez, D, Rueda, A, Huertas, J. “Low-cost signature test of Rf blocks based on envelope response analysis”. Proceedings of the 15th European Test Symposium (ETS 2010), Prague, Czech Republic, 2010. doi: 10.1109/ETSYM.2010.5512780 |
| dc.identifier.doi.es.fl_str_mv | doi: 10.1109/ETSYM.2010.5512780 |
| dc.identifier.uri.none.fl_str_mv | https://hdl.handle.net/20.500.12008/38641 |
| dc.language.iso.none.fl_str_mv | en eng |
| dc.publisher.es.fl_str_mv | IEEE |
| dc.relation.ispartof.es.fl_str_mv | 15th European Test Symposium (ETS 2010), Prague, Czech Republic, 2010 |
| dc.rights.license.none.fl_str_mv | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| dc.rights.none.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.source.none.fl_str_mv | reponame:COLIBRI instname:Universidad de la República instacron:Universidad de la República |
| dc.subject.es.fl_str_mv | RF test RF BIST Signature test |
| dc.title.none.fl_str_mv | Low-cost signature test of Rf blocks based on envelope response analysis |
| dc.type.es.fl_str_mv | Ponencia |
| dc.type.none.fl_str_mv | info:eu-repo/semantics/conferenceObject |
| dc.type.version.none.fl_str_mv | info:eu-repo/semantics/publishedVersion |
| description | This paper presents a novel and low-cost methodologythat can be used for testing RF blocks embedded in complex SoCs.It is based on the detection and analysis of the two-tone responseenvelope of the device under test (DUT). The response envelope isprocessed to obtain a simple digital signature sensitive to keyspecifications of the DUT. The analytical basis of the proposedmethodology is demonstrated, and a proposal for itsimplementation as a built-in test core is discussed. Finally,practical simulation examples show the feasibility of the approach. |
| eu_rights_str_mv | openAccess |
| format | conferenceObject |
| id | COLIBRI_e38caba1087d2234c3d201bb8bc197ee |
| identifier_str_mv | Barragán, M. Fiorelli, R, Vázquez, D, Rueda, A, Huertas, J. “Low-cost signature test of Rf blocks based on envelope response analysis”. Proceedings of the 15th European Test Symposium (ETS 2010), Prague, Czech Republic, 2010. doi: 10.1109/ETSYM.2010.5512780 doi: 10.1109/ETSYM.2010.5512780 |
| instacron_str | Universidad de la República |
| institution | Universidad de la República |
| instname_str | Universidad de la República |
| language | eng |
| language_invalid_str_mv | en |
| network_acronym_str | COLIBRI |
| network_name_str | COLIBRI |
| oai_identifier_str | oai:colibri.udelar.edu.uy:20.500.12008/38641 |
| publishDate | 2010 |
| reponame_str | COLIBRI |
| repository.mail.fl_str_mv | mabel.seroubian@seciu.edu.uy |
| repository.name.fl_str_mv | COLIBRI - Universidad de la República |
| repository_id_str | 4771 |
| rights_invalid_str_mv | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| spelling | 2023-08-01T20:33:08Z2023-08-01T20:33:08Z201020230801Barragán, M. Fiorelli, R, Vázquez, D, Rueda, A, Huertas, J. “Low-cost signature test of Rf blocks based on envelope response analysis”. Proceedings of the 15th European Test Symposium (ETS 2010), Prague, Czech Republic, 2010. doi: 10.1109/ETSYM.2010.5512780https://hdl.handle.net/20.500.12008/38641doi: 10.1109/ETSYM.2010.5512780This paper presents a novel and low-cost methodologythat can be used for testing RF blocks embedded in complex SoCs.It is based on the detection and analysis of the two-tone responseenvelope of the device under test (DUT). The response envelope isprocessed to obtain a simple digital signature sensitive to keyspecifications of the DUT. The analytical basis of the proposedmethodology is demonstrated, and a proposal for itsimplementation as a built-in test core is discussed. Finally,practical simulation examples show the feasibility of the approach.Made available in DSpace on 2023-08-01T20:33:08Z (GMT). No. of bitstreams: 5 BFVRH09.pdf: 646471 bytes, checksum: 349de9bdf5387825492fa0faa03a73d1 (MD5) license_text: 21936 bytes, checksum: 9833653f73f7853880c94a6fead477b1 (MD5) license_url: 49 bytes, checksum: 4afdbb8c545fd630ea7db775da747b2f (MD5) license_rdf: 23148 bytes, checksum: 9da0b6dfac957114c6a7714714b86306 (MD5) license.txt: 4194 bytes, checksum: 7f2e2c17ef6585de66da58d1bfa8b5e1 (MD5) Previous issue date: 2010enengIEEE15th European Test Symposium (ETS 2010), Prague, Czech Republic, 2010Las obras depositadas en el Repositorio se rigen por la Ordenanza de los Derechos de la Propiedad Intelectual de la Universidad De La República. (Res. Nº 91 de C.D.C. de 8/III/1994 – D.O. 7/IV/1994) y por la Ordenanza del Repositorio Abierto de la Universidad de la República (Res. Nº 16 de C.D.C. de 07/10/2014)info:eu-repo/semantics/openAccessLicencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)RF testRF BISTSignature testLow-cost signature test of Rf blocks based on envelope response analysisPonenciainfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersionreponame:COLIBRIinstname:Universidad de la Repúblicainstacron:Universidad de la RepúblicaBarragán, Manuel JFiorelli, RafaellaVázquez, DiegoRueda, AdoraciónHuertas, José 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- Universidad de la Repúblicafalse |
| spellingShingle | Low-cost signature test of Rf blocks based on envelope response analysis Barragán, Manuel J RF test RF BIST Signature test |
| status_str | publishedVersion |
| title | Low-cost signature test of Rf blocks based on envelope response analysis |
| title_full | Low-cost signature test of Rf blocks based on envelope response analysis |
| title_fullStr | Low-cost signature test of Rf blocks based on envelope response analysis |
| title_full_unstemmed | Low-cost signature test of Rf blocks based on envelope response analysis |
| title_short | Low-cost signature test of Rf blocks based on envelope response analysis |
| title_sort | Low-cost signature test of Rf blocks based on envelope response analysis |
| topic | RF test RF BIST Signature test |
| url | https://hdl.handle.net/20.500.12008/38641 |
