Low-cost signature test of Rf blocks based on envelope response analysis
Resumen:
This paper presents a novel and low-cost methodologythat can be used for testing RF blocks embedded in complex SoCs.It is based on the detection and analysis of the two-tone responseenvelope of the device under test (DUT). The response envelope isprocessed to obtain a simple digital signature sensitive to keyspecifications of the DUT. The analytical basis of the proposedmethodology is demonstrated, and a proposal for itsimplementation as a built-in test core is discussed. Finally,practical simulation examples show the feasibility of the approach.
| 2010 | |
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RF test RF BIST Signature test |
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| Inglés | |
| Universidad de la República | |
| COLIBRI | |
| https://hdl.handle.net/20.500.12008/38641 | |
| Acceso abierto | |
| Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| Sumario: | This paper presents a novel and low-cost methodologythat can be used for testing RF blocks embedded in complex SoCs.It is based on the detection and analysis of the two-tone responseenvelope of the device under test (DUT). The response envelope isprocessed to obtain a simple digital signature sensitive to keyspecifications of the DUT. The analytical basis of the proposedmethodology is demonstrated, and a proposal for itsimplementation as a built-in test core is discussed. Finally,practical simulation examples show the feasibility of the approach. |
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