Temperature controlled measurement system for precise characterization of electronic circuits and devices
Resumen:
A temperature controlled oven, with provisions for easy connection of instruments to the device under test, was designed and built. This paper describes the oven, its thermal model and control system and presents measurement results with different temperature profiles. An NTC thermistor measures the system temperature and a modified Steinhart
Hart equation is used to convert resistance readings to temperature. The system is capable of setting its temperature from just over ambient temperature up to 375 K (around 102 ∘C). Temperature stability is ultimately limited by the resolution of temperature measurement to ±2 mK
| 2014 | |
| Electrónica | |
| Inglés | |
| Universidad de la República | |
| COLIBRI | |
| https://hdl.handle.net/20.500.12008/41785 | |
| Acceso abierto | |
| Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| _version_ | 1807522938911457280 |
|---|---|
| author | Aguirre, Pablo |
| author2 | Rossi, Conrado |
| author2_role | author |
| author_facet | Aguirre, Pablo Rossi, Conrado |
| author_role | author |
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| collection | COLIBRI |
| dc.creator.none.fl_str_mv | Aguirre, Pablo Rossi, Conrado |
| dc.date.accessioned.none.fl_str_mv | 2023-12-11T19:57:45Z |
| dc.date.available.none.fl_str_mv | 2023-12-11T19:57:45Z |
| dc.date.issued.es.fl_str_mv | 2014 |
| dc.date.submitted.es.fl_str_mv | 20231211 |
| dc.description.abstract.none.fl_txt_mv | A temperature controlled oven, with provisions for easy connection of instruments to the device under test, was designed and built. This paper describes the oven, its thermal model and control system and presents measurement results with different temperature profiles. An NTC thermistor measures the system temperature and a modified Steinhart Hart equation is used to convert resistance readings to temperature. The system is capable of setting its temperature from just over ambient temperature up to 375 K (around 102 ∘C). Temperature stability is ultimately limited by the resolution of temperature measurement to ±2 mK |
| dc.description.es.fl_txt_mv | Trabajo presentado a International Instrumentation and Measurement Technology Conference (I2MTC) Montevideo, Uruguay, 12-15 may., 2014 |
| dc.identifier.citation.es.fl_str_mv | Aguirre, P, Rossi Aicardi, C. "Temperature controlled measurement system for precise characterization of electronic circuits and devices" Publicado en: Proceedings of the International Instrumentation and Measurement Technology Conference (I2MTC). Montevideo, Uruguay, 12-15 may., 2014, p. 1492-1495, doi: 10.1109/I2MTC.2014.6860994. |
| dc.identifier.uri.none.fl_str_mv | https://hdl.handle.net/20.500.12008/41785 |
| dc.language.iso.none.fl_str_mv | en eng |
| dc.rights.license.none.fl_str_mv | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| dc.rights.none.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.source.none.fl_str_mv | reponame:COLIBRI instname:Universidad de la República instacron:Universidad de la República |
| dc.subject.other.es.fl_str_mv | Electrónica |
| dc.title.none.fl_str_mv | Temperature controlled measurement system for precise characterization of electronic circuits and devices |
| dc.type.es.fl_str_mv | Ponencia |
| dc.type.none.fl_str_mv | info:eu-repo/semantics/conferenceObject |
| dc.type.version.none.fl_str_mv | info:eu-repo/semantics/publishedVersion |
| description | Trabajo presentado a International Instrumentation and Measurement Technology Conference (I2MTC) Montevideo, Uruguay, 12-15 may., 2014 |
| eu_rights_str_mv | openAccess |
| format | conferenceObject |
| id | COLIBRI_a09cefe9e11a9fd57c895aadfaa15246 |
| identifier_str_mv | Aguirre, P, Rossi Aicardi, C. "Temperature controlled measurement system for precise characterization of electronic circuits and devices" Publicado en: Proceedings of the International Instrumentation and Measurement Technology Conference (I2MTC). Montevideo, Uruguay, 12-15 may., 2014, p. 1492-1495, doi: 10.1109/I2MTC.2014.6860994. |
| instacron_str | Universidad de la República |
| institution | Universidad de la República |
| instname_str | Universidad de la República |
| language | eng |
| language_invalid_str_mv | en |
| network_acronym_str | COLIBRI |
| network_name_str | COLIBRI |
| oai_identifier_str | oai:colibri.udelar.edu.uy:20.500.12008/41785 |
| publishDate | 2014 |
| reponame_str | COLIBRI |
| repository.mail.fl_str_mv | mabel.seroubian@seciu.edu.uy |
| repository.name.fl_str_mv | COLIBRI - Universidad de la República |
| repository_id_str | 4771 |
| rights_invalid_str_mv | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| spelling | 2023-12-11T19:57:45Z2023-12-11T19:57:45Z201420231211Aguirre, P, Rossi Aicardi, C. "Temperature controlled measurement system for precise characterization of electronic circuits and devices" Publicado en: Proceedings of the International Instrumentation and Measurement Technology Conference (I2MTC). Montevideo, Uruguay, 12-15 may., 2014, p. 1492-1495, doi: 10.1109/I2MTC.2014.6860994.https://hdl.handle.net/20.500.12008/41785Trabajo presentado a International Instrumentation and Measurement Technology Conference (I2MTC) Montevideo, Uruguay, 12-15 may., 2014A temperature controlled oven, with provisions for easy connection of instruments to the device under test, was designed and built. This paper describes the oven, its thermal model and control system and presents measurement results with different temperature profiles. An NTC thermistor measures the system temperature and a modified SteinhartHart equation is used to convert resistance readings to temperature. The system is capable of setting its temperature from just over ambient temperature up to 375 K (around 102 ∘C). Temperature stability is ultimately limited by the resolution of temperature measurement to ±2 mKMade available in DSpace on 2023-12-11T19:57:45Z (GMT). No. of bitstreams: 5 AR14.pdf: 1163613 bytes, checksum: 19666ba3246eca0f2d8db63a2fd629a0 (MD5) license_text: 21936 bytes, checksum: 9833653f73f7853880c94a6fead477b1 (MD5) license_url: 49 bytes, checksum: 4afdbb8c545fd630ea7db775da747b2f (MD5) license_rdf: 23148 bytes, checksum: 9da0b6dfac957114c6a7714714b86306 (MD5) license.txt: 4244 bytes, checksum: 528b6a3c8c7d0c6e28129d576e989607 (MD5) Previous issue date: 2014enengLas obras depositadas en el Repositorio se rigen por la Ordenanza de los Derechos de la Propiedad Intelectual de la Universidad De La República. (Res. Nº 91 de C.D.C. de 8/III/1994 – D.O. 7/IV/1994) y por la Ordenanza del Repositorio Abierto de la Universidad de la República (Res. Nº 16 de C.D.C. de 07/10/2014)info:eu-repo/semantics/openAccessLicencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)ElectrónicaTemperature controlled measurement system for precise characterization of electronic circuits and devicesPonenciainfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersionreponame:COLIBRIinstname:Universidad de la Repúblicainstacron:Universidad de la RepúblicaAguirre, PabloRossi, 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- Universidad de la Repúblicafalse |
| spellingShingle | Temperature controlled measurement system for precise characterization of electronic circuits and devices Aguirre, Pablo Electrónica |
| status_str | publishedVersion |
| title | Temperature controlled measurement system for precise characterization of electronic circuits and devices |
| title_full | Temperature controlled measurement system for precise characterization of electronic circuits and devices |
| title_fullStr | Temperature controlled measurement system for precise characterization of electronic circuits and devices |
| title_full_unstemmed | Temperature controlled measurement system for precise characterization of electronic circuits and devices |
| title_short | Temperature controlled measurement system for precise characterization of electronic circuits and devices |
| title_sort | Temperature controlled measurement system for precise characterization of electronic circuits and devices |
| topic | Electrónica |
| url | https://hdl.handle.net/20.500.12008/41785 |
