Aguirre, P., & Rossi, C. (2014). Temperature controlled measurement system for precise characterization of electronic circuits and devices.
Cita Chicago Style (17a ed.)Aguirre, Pablo, y Conrado Rossi. Temperature Controlled Measurement System for Precise Characterization of Electronic Circuits and Devices. 2014.
Cita MLA (9a ed.)Aguirre, Pablo, y Conrado Rossi. Temperature Controlled Measurement System for Precise Characterization of Electronic Circuits and Devices. 2014.
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