A BIST solution for the functional characterization of RF systems based on envelope response analysis
Resumen:
This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be easily extracted from the envelope signal. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach.
| 2009 | |
| Inglés | |
| Universidad de la República | |
| COLIBRI | |
| https://hdl.handle.net/20.500.12008/38642 | |
| Acceso abierto | |
| Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| _version_ | 1807522933444182016 |
|---|---|
| author | Barragán, Manuel J |
| author2 | Fiorelli, Rafaella Vázquez, Diego Rueda, Adoración Huertas, José Luis |
| author2_role | author author author author |
| author_facet | Barragán, Manuel J Fiorelli, Rafaella Vázquez, Diego Rueda, Adoración Huertas, José Luis |
| author_role | author |
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| collection | COLIBRI |
| dc.creator.none.fl_str_mv | Barragán, Manuel J Fiorelli, Rafaella Vázquez, Diego Rueda, Adoración Huertas, José Luis |
| dc.date.accessioned.none.fl_str_mv | 2023-08-01T20:33:09Z |
| dc.date.available.none.fl_str_mv | 2023-08-01T20:33:09Z |
| dc.date.issued.es.fl_str_mv | 2009 |
| dc.date.submitted.es.fl_str_mv | 20230801 |
| dc.description.abstract.none.fl_txt_mv | This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be easily extracted from the envelope signal. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach. |
| dc.identifier.citation.es.fl_str_mv | Barragán, M, Fiorelli, R, Vázquez, D, Rueda, A, Huertas, J. “A BIST solution for the functional characterization of RF systems based on envelope response analysis”. Proceedings of the 18th Asian Test Symposium, ATS 2009,Taichung, Taiwan, 2009. doi: 10.1109/ATS.2009.14 |
| dc.identifier.doi.es.fl_str_mv | doi: 10.1109/ATS.2009.14 |
| dc.identifier.uri.none.fl_str_mv | https://hdl.handle.net/20.500.12008/38642 |
| dc.language.iso.none.fl_str_mv | en eng |
| dc.publisher.es.fl_str_mv | IEEE |
| dc.relation.ispartof.es.fl_str_mv | 18th Asian Test Symposium, ATS 2009,Taichung, Taiwan, 2009 |
| dc.rights.license.none.fl_str_mv | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| dc.rights.none.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.source.none.fl_str_mv | reponame:COLIBRI instname:Universidad de la República instacron:Universidad de la República |
| dc.title.none.fl_str_mv | A BIST solution for the functional characterization of RF systems based on envelope response analysis |
| dc.type.es.fl_str_mv | Ponencia |
| dc.type.none.fl_str_mv | info:eu-repo/semantics/conferenceObject |
| dc.type.version.none.fl_str_mv | info:eu-repo/semantics/publishedVersion |
| description | This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be easily extracted from the envelope signal. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach. |
| eu_rights_str_mv | openAccess |
| format | conferenceObject |
| id | COLIBRI_95411427979e26cadc7369804d9d917f |
| identifier_str_mv | Barragán, M, Fiorelli, R, Vázquez, D, Rueda, A, Huertas, J. “A BIST solution for the functional characterization of RF systems based on envelope response analysis”. Proceedings of the 18th Asian Test Symposium, ATS 2009,Taichung, Taiwan, 2009. doi: 10.1109/ATS.2009.14 doi: 10.1109/ATS.2009.14 |
| instacron_str | Universidad de la República |
| institution | Universidad de la República |
| instname_str | Universidad de la República |
| language | eng |
| language_invalid_str_mv | en |
| network_acronym_str | COLIBRI |
| network_name_str | COLIBRI |
| oai_identifier_str | oai:colibri.udelar.edu.uy:20.500.12008/38642 |
| publishDate | 2009 |
| reponame_str | COLIBRI |
| repository.mail.fl_str_mv | mabel.seroubian@seciu.edu.uy |
| repository.name.fl_str_mv | COLIBRI - Universidad de la República |
| repository_id_str | 4771 |
| rights_invalid_str_mv | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| spelling | 2023-08-01T20:33:09Z2023-08-01T20:33:09Z200920230801Barragán, M, Fiorelli, R, Vázquez, D, Rueda, A, Huertas, J. “A BIST solution for the functional characterization of RF systems based on envelope response analysis”. Proceedings of the 18th Asian Test Symposium, ATS 2009,Taichung, Taiwan, 2009. doi: 10.1109/ATS.2009.14https://hdl.handle.net/20.500.12008/38642doi: 10.1109/ATS.2009.14This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be easily extracted from the envelope signal. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach.Made available in DSpace on 2023-08-01T20:33:09Z (GMT). No. of bitstreams: 5 BFVRH09a.pdf: 228351 bytes, checksum: 38ef8b21bfc8378a8e142221aa35d073 (MD5) license_text: 21936 bytes, checksum: 9833653f73f7853880c94a6fead477b1 (MD5) license_url: 49 bytes, checksum: 4afdbb8c545fd630ea7db775da747b2f (MD5) license_rdf: 23148 bytes, checksum: 9da0b6dfac957114c6a7714714b86306 (MD5) license.txt: 4194 bytes, checksum: 7f2e2c17ef6585de66da58d1bfa8b5e1 (MD5) Previous issue date: 2009enengIEEE18th Asian Test Symposium, ATS 2009,Taichung, Taiwan, 2009Las obras depositadas en el Repositorio se rigen por la Ordenanza de los Derechos de la Propiedad Intelectual de la Universidad De La República. (Res. Nº 91 de C.D.C. de 8/III/1994 – D.O. 7/IV/1994) y por la Ordenanza del Repositorio Abierto de la Universidad de la República (Res. Nº 16 de C.D.C. de 07/10/2014)info:eu-repo/semantics/openAccessLicencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)A BIST solution for the functional characterization of RF systems based on envelope response analysisPonenciainfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersionreponame:COLIBRIinstname:Universidad de la Repúblicainstacron:Universidad de la RepúblicaBarragán, Manuel JFiorelli, RafaellaVázquez, DiegoRueda, AdoraciónHuertas, José 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- Universidad de la Repúblicafalse |
| spellingShingle | A BIST solution for the functional characterization of RF systems based on envelope response analysis Barragán, Manuel J |
| status_str | publishedVersion |
| title | A BIST solution for the functional characterization of RF systems based on envelope response analysis |
| title_full | A BIST solution for the functional characterization of RF systems based on envelope response analysis |
| title_fullStr | A BIST solution for the functional characterization of RF systems based on envelope response analysis |
| title_full_unstemmed | A BIST solution for the functional characterization of RF systems based on envelope response analysis |
| title_short | A BIST solution for the functional characterization of RF systems based on envelope response analysis |
| title_sort | A BIST solution for the functional characterization of RF systems based on envelope response analysis |
| url | https://hdl.handle.net/20.500.12008/38642 |
