On-chip characterization of RF systems based on envelope response analysis
Resumen:
A simple on-chip procedure for testing embedded RF blocks is presented. It is based on the detection and spectral analysis of the two-tone response envelope of the device under test (DUT). A main difference with similar methods is its inherent simplicity, avoiding a preprocessing stage and resorting to simpler circuitry to process the envelope. As a consequence, the main nonlinearity specifications of the DUT can be easily estimated from the envelope signal without the need of expensive RF test equipment.
| 2010 | |
| Inglés | |
| Universidad de la República | |
| COLIBRI | |
| https://hdl.handle.net/20.500.12008/38699 | |
| Acceso abierto | |
| Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| _version_ | 1807522934448717824 |
|---|---|
| author | Barragán, Manuel J |
| author2 | Fiorelli, Rafaella Vázquez, Diego Rueda, Adoración Huertas, José Luis |
| author2_role | author author author author |
| author_facet | Barragán, Manuel J Fiorelli, Rafaella Vázquez, Diego Rueda, Adoración Huertas, José Luis |
| author_role | author |
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| collection | COLIBRI |
| dc.creator.none.fl_str_mv | Barragán, Manuel J Fiorelli, Rafaella Vázquez, Diego Rueda, Adoración Huertas, José Luis |
| dc.date.accessioned.none.fl_str_mv | 2023-08-01T20:33:23Z |
| dc.date.available.none.fl_str_mv | 2023-08-01T20:33:23Z |
| dc.date.issued.es.fl_str_mv | 2010 |
| dc.date.submitted.es.fl_str_mv | 20230801 |
| dc.description.abstract.none.fl_txt_mv | A simple on-chip procedure for testing embedded RF blocks is presented. It is based on the detection and spectral analysis of the two-tone response envelope of the device under test (DUT). A main difference with similar methods is its inherent simplicity, avoiding a preprocessing stage and resorting to simpler circuitry to process the envelope. As a consequence, the main nonlinearity specifications of the DUT can be easily estimated from the envelope signal without the need of expensive RF test equipment. |
| dc.identifier.citation.es.fl_str_mv | Barragan, M.J., Fiorelli R., Vazquez, D., Rueda, A., Huertas, JL. On-chip characterisation of RF systems based on envelope response analysis [Preprint] Publicado en Electronics Letters, 2010, v. 46, no. 1. doi: 10.1049/el.2010.2644. |
| dc.identifier.uri.none.fl_str_mv | https://hdl.handle.net/20.500.12008/38699 |
| dc.language.iso.none.fl_str_mv | en eng |
| dc.rights.license.none.fl_str_mv | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| dc.rights.none.fl_str_mv | info:eu-repo/semantics/openAccess |
| dc.source.none.fl_str_mv | reponame:COLIBRI instname:Universidad de la República instacron:Universidad de la República |
| dc.title.none.fl_str_mv | On-chip characterization of RF systems based on envelope response analysis |
| dc.type.es.fl_str_mv | Preprint |
| dc.type.none.fl_str_mv | info:eu-repo/semantics/preprint |
| dc.type.version.none.fl_str_mv | info:eu-repo/semantics/submittedVersion |
| description | A simple on-chip procedure for testing embedded RF blocks is presented. It is based on the detection and spectral analysis of the two-tone response envelope of the device under test (DUT). A main difference with similar methods is its inherent simplicity, avoiding a preprocessing stage and resorting to simpler circuitry to process the envelope. As a consequence, the main nonlinearity specifications of the DUT can be easily estimated from the envelope signal without the need of expensive RF test equipment. |
| eu_rights_str_mv | openAccess |
| format | preprint |
| id | COLIBRI_459ff5b6748046f3ba6a43552fc7c8c1 |
| identifier_str_mv | Barragan, M.J., Fiorelli R., Vazquez, D., Rueda, A., Huertas, JL. On-chip characterisation of RF systems based on envelope response analysis [Preprint] Publicado en Electronics Letters, 2010, v. 46, no. 1. doi: 10.1049/el.2010.2644. |
| instacron_str | Universidad de la República |
| institution | Universidad de la República |
| instname_str | Universidad de la República |
| language | eng |
| language_invalid_str_mv | en |
| network_acronym_str | COLIBRI |
| network_name_str | COLIBRI |
| oai_identifier_str | oai:colibri.udelar.edu.uy:20.500.12008/38699 |
| publishDate | 2010 |
| reponame_str | COLIBRI |
| repository.mail.fl_str_mv | mabel.seroubian@seciu.edu.uy |
| repository.name.fl_str_mv | COLIBRI - Universidad de la República |
| repository_id_str | 4771 |
| rights_invalid_str_mv | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| spelling | 2023-08-01T20:33:23Z2023-08-01T20:33:23Z201020230801Barragan, M.J., Fiorelli R., Vazquez, D., Rueda, A., Huertas, JL. On-chip characterisation of RF systems based on envelope response analysis [Preprint] Publicado en Electronics Letters, 2010, v. 46, no. 1. doi: 10.1049/el.2010.2644.https://hdl.handle.net/20.500.12008/38699A simple on-chip procedure for testing embedded RF blocks is presented. It is based on the detection and spectral analysis of the two-tone response envelope of the device under test (DUT). A main difference with similar methods is its inherent simplicity, avoiding a preprocessing stage and resorting to simpler circuitry to process the envelope. As a consequence, the main nonlinearity specifications of the DUT can be easily estimated from the envelope signal without the need of expensive RF test equipment.Made available in DSpace on 2023-08-01T20:33:23Z (GMT). No. of bitstreams: 5 BFVRH10.pdf: 78265 bytes, checksum: 68c80668320a104a83e8aafc5467a8ad (MD5) license_text: 21936 bytes, checksum: 9833653f73f7853880c94a6fead477b1 (MD5) license_url: 49 bytes, checksum: 4afdbb8c545fd630ea7db775da747b2f (MD5) license_rdf: 23148 bytes, checksum: 9da0b6dfac957114c6a7714714b86306 (MD5) license.txt: 4194 bytes, checksum: 7f2e2c17ef6585de66da58d1bfa8b5e1 (MD5) Previous issue date: 2010enengLas obras depositadas en el Repositorio se rigen por la Ordenanza de los Derechos de la Propiedad Intelectual de la Universidad De La República. (Res. Nº 91 de C.D.C. de 8/III/1994 – D.O. 7/IV/1994) y por la Ordenanza del Repositorio Abierto de la Universidad de la República (Res. Nº 16 de C.D.C. de 07/10/2014)info:eu-repo/semantics/openAccessLicencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)On-chip characterization of RF systems based on envelope response analysisPreprintinfo:eu-repo/semantics/preprintinfo:eu-repo/semantics/submittedVersionreponame:COLIBRIinstname:Universidad de la Repúblicainstacron:Universidad de la RepúblicaBarragán, Manuel JFiorelli, RafaellaVázquez, DiegoRueda, AdoraciónHuertas, José 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- Universidad de la Repúblicafalse |
| spellingShingle | On-chip characterization of RF systems based on envelope response analysis Barragán, Manuel J |
| status_str | submittedVersion |
| title | On-chip characterization of RF systems based on envelope response analysis |
| title_full | On-chip characterization of RF systems based on envelope response analysis |
| title_fullStr | On-chip characterization of RF systems based on envelope response analysis |
| title_full_unstemmed | On-chip characterization of RF systems based on envelope response analysis |
| title_short | On-chip characterization of RF systems based on envelope response analysis |
| title_sort | On-chip characterization of RF systems based on envelope response analysis |
| url | https://hdl.handle.net/20.500.12008/38699 |
