Automatic system for calibrating Zener-based voltage standards

Trigo, Leonardo - de Souza, Heriguatí - Slomovitz, Daniel

Resumen:

An automatic system was developed to intercompare Zener voltage standards. It comprises a low-emf voltage scanner, a voltmeter, a temperature scanner, an ohmmeter and software. Up to 10 units can be tested at the same time, with a full measurement round of 60 minutes. In this way, the system continuously records around 24 individual measurement values per day for each individual Zener. Typical results are shown.


Detalles Bibliográficos
2022
Metrología
Patrón
Incertidumbre
Tensión
Josephson
Inglés
Universidad de la República
COLIBRI
https://www.cenam.mx/simposio2022
https://hdl.handle.net/20.500.12008/34946
Acceso abierto
Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)
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author Trigo, Leonardo
author2 de Souza, Heriguatí
Slomovitz, Daniel
author2_role author
author
author_facet Trigo, Leonardo
de Souza, Heriguatí
Slomovitz, Daniel
author_role author
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collection COLIBRI
dc.contributor.filiacion.none.fl_str_mv Trigo Leonardo, UTE Laboratorio
de Souza Heriguatí, UTE Laboratorio
Slomovitz Daniel, Universidad de la República (Uruguay). Facultad de Ingeniería.
dc.creator.none.fl_str_mv Trigo, Leonardo
de Souza, Heriguatí
Slomovitz, Daniel
dc.date.accessioned.none.fl_str_mv 2022-11-21T16:45:05Z
dc.date.available.none.fl_str_mv 2022-11-21T16:45:05Z
dc.date.issued.none.fl_str_mv 2022
dc.description.abstract.none.fl_txt_mv An automatic system was developed to intercompare Zener voltage standards. It comprises a low-emf voltage scanner, a voltmeter, a temperature scanner, an ohmmeter and software. Up to 10 units can be tested at the same time, with a full measurement round of 60 minutes. In this way, the system continuously records around 24 individual measurement values per day for each individual Zener. Typical results are shown.
dc.description.es.fl_txt_mv Simposio de Metrología 2022, organizado por el CENAM (Centro Nacional de Metrología de México), llevado a cabo del 26 al 28 de octubre de 2022, en modalidad virtual. El lema de esta edición es : "Transformación digital para una vida mejor"
dc.format.extent.es.fl_str_mv 7 p.
dc.format.mimetype.es.fl_str_mv application/pdf
dc.identifier.citation.es.fl_str_mv Trigo, L., de Souza, H. y Slomovitz, D. Automatic system for calibrating Zener-based voltage standards [en línea]. EN: Simposio de Metrología 2022, México, 26-28 oct 2022, pp 1-7.
dc.identifier.uri.none.fl_str_mv https://www.cenam.mx/simposio2022
https://hdl.handle.net/20.500.12008/34946
dc.language.iso.none.fl_str_mv en
eng
dc.publisher.es.fl_str_mv Centro Nacional de Metrología (CENAM)
dc.relation.ispartof.es.fl_str_mv Simposio de Metrología 2022, México, 26-28 oct. 2022, pp. 1-7.
dc.rights.license.none.fl_str_mv Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
dc.source.none.fl_str_mv reponame:COLIBRI
instname:Universidad de la República
instacron:Universidad de la República
dc.subject.es.fl_str_mv Metrología
Patrón
Incertidumbre
Tensión
Josephson
dc.title.none.fl_str_mv Automatic system for calibrating Zener-based voltage standards
dc.type.es.fl_str_mv Ponencia
dc.type.none.fl_str_mv info:eu-repo/semantics/conferenceObject
dc.type.version.none.fl_str_mv info:eu-repo/semantics/publishedVersion
description Simposio de Metrología 2022, organizado por el CENAM (Centro Nacional de Metrología de México), llevado a cabo del 26 al 28 de octubre de 2022, en modalidad virtual. El lema de esta edición es : "Transformación digital para una vida mejor"
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identifier_str_mv Trigo, L., de Souza, H. y Slomovitz, D. Automatic system for calibrating Zener-based voltage standards [en línea]. EN: Simposio de Metrología 2022, México, 26-28 oct 2022, pp 1-7.
instacron_str Universidad de la República
institution Universidad de la República
instname_str Universidad de la República
language eng
language_invalid_str_mv en
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repository.mail.fl_str_mv mabel.seroubian@seciu.edu.uy
repository.name.fl_str_mv COLIBRI - Universidad de la República
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rights_invalid_str_mv Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)
spelling Trigo Leonardo, UTE Laboratoriode Souza Heriguatí, UTE LaboratorioSlomovitz Daniel, Universidad de la República (Uruguay). Facultad de Ingeniería.2022-11-21T16:45:05Z2022-11-21T16:45:05Z2022Trigo, L., de Souza, H. y Slomovitz, D. Automatic system for calibrating Zener-based voltage standards [en línea]. EN: Simposio de Metrología 2022, México, 26-28 oct 2022, pp 1-7.https://www.cenam.mx/simposio2022https://hdl.handle.net/20.500.12008/34946Simposio de Metrología 2022, organizado por el CENAM (Centro Nacional de Metrología de México), llevado a cabo del 26 al 28 de octubre de 2022, en modalidad virtual. El lema de esta edición es : "Transformación digital para una vida mejor"An automatic system was developed to intercompare Zener voltage standards. It comprises a low-emf voltage scanner, a voltmeter, a temperature scanner, an ohmmeter and software. Up to 10 units can be tested at the same time, with a full measurement round of 60 minutes. In this way, the system continuously records around 24 individual measurement values per day for each individual Zener. Typical results are shown.Submitted by Ribeiro Jorge (jribeiro@fing.edu.uy) on 2022-11-20T20:48:04Z No. of bitstreams: 2 license_rdf: 23149 bytes, checksum: 1996b8461bc290aef6a27d78c67b6b52 (MD5) TDS22.pdf: 630342 bytes, checksum: 3c969bada255479bf2c33103eb8b191a (MD5)Approved for entry into archive by Machado Jimena (jmachado@fing.edu.uy) on 2022-11-21T16:41:33Z (GMT) No. of bitstreams: 2 license_rdf: 23149 bytes, checksum: 1996b8461bc290aef6a27d78c67b6b52 (MD5) TDS22.pdf: 630342 bytes, checksum: 3c969bada255479bf2c33103eb8b191a (MD5)Made available in DSpace by Luna Fabiana (fabiana.luna@seciu.edu.uy) on 2022-11-21T16:45:05Z (GMT). No. of bitstreams: 2 license_rdf: 23149 bytes, checksum: 1996b8461bc290aef6a27d78c67b6b52 (MD5) TDS22.pdf: 630342 bytes, checksum: 3c969bada255479bf2c33103eb8b191a (MD5) Previous issue date: 20227 p.application/pdfenengCentro Nacional de Metrología (CENAM)Simposio de Metrología 2022, México, 26-28 oct. 2022, pp. 1-7.Las obras depositadas en el Repositorio se rigen por la Ordenanza de los Derechos de la Propiedad Intelectual de la Universidad de la República.(Res. Nº 91 de C.D.C. de 8/III/1994 – D.O. 7/IV/1994) y por la Ordenanza del Repositorio Abierto de la Universidad de la República (Res. Nº 16 de C.D.C. de 07/10/2014)info:eu-repo/semantics/openAccessLicencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)MetrologíaPatrónIncertidumbreTensiónJosephsonAutomatic system for calibrating Zener-based voltage standardsPonenciainfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersionreponame:COLIBRIinstname:Universidad de la Repúblicainstacron:Universidad de la RepúblicaTrigo, Leonardode Souza, HeriguatíSlomovitz, DanielLICENSElicense.txtlicense.txttext/plain; charset=utf-84267http://localhost:8080/xmlui/bitstream/20.500.12008/34946/5/license.txt6429389a7df7277b72b7924fdc7d47a9MD55CC-LICENSElicense_urllicense_urltext/plain; charset=utf-850http://localhost:8080/xmlui/bitstream/20.500.12008/34946/2/license_urla006180e3f5b2ad0b88185d14284c0e0MD52license_textlicense_texttext/html; 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- Universidad de la Repúblicafalse
spellingShingle Automatic system for calibrating Zener-based voltage standards
Trigo, Leonardo
Metrología
Patrón
Incertidumbre
Tensión
Josephson
status_str publishedVersion
title Automatic system for calibrating Zener-based voltage standards
title_full Automatic system for calibrating Zener-based voltage standards
title_fullStr Automatic system for calibrating Zener-based voltage standards
title_full_unstemmed Automatic system for calibrating Zener-based voltage standards
title_short Automatic system for calibrating Zener-based voltage standards
title_sort Automatic system for calibrating Zener-based voltage standards
topic Metrología
Patrón
Incertidumbre
Tensión
Josephson
url https://www.cenam.mx/simposio2022
https://hdl.handle.net/20.500.12008/34946